First Silicon FIB Edit

With our Focused Ion Beam (FIB)system we can repair/modify your ICs.  

We offer full front and backsided FIB edit service using the latest FIB systems. We have state of the art sample decapsulation tools and know how to prepare the samples for the actual FIB edit. We have more than 20 years experience with FIB circuit edits and we have done several succesful projects on processes nodes down to 28nm. 


  • Decapsulation and re-encapsulation
  • GDS driven navigation
  • Front & backside edits
  • Low resistance metal deposition
  • Insulator deposition
  • Support for all IC processes

Your Benefits:

  • be 100% sure that your well-thought-out modification really fixes the issue
  • be sure that the initial issue was not masking other (unknown) issues 
  • reduce the time to market
  • having working samples before the final silicon arrives

Our goal is to make your chip work!!

Need more information?

Detailed technical information can be found in our FIB-CE leaflet:

Please feel free to contact us or to send an inquiry to our sales team!